| XWJ-4XC Specification | |
| Eyepiece | Wide field WF10x(μ18mm) |
| Objective | Plan achromatic objectives with long working distance (no cover glass)PL 10X/0.25 |
| Plan achromatic objectives with long working distance(no cover glass)PLL20X/0.40 | |
| Plan achromatic objectives with long working distance(no cover glass)PLL40X/0.60 | |
| Plan achromatic objectives with long working distance (no cover glass)PL100X/1.25(Spring, oil) | |
| Eyepieces tube | Trinocular, Inclination of 30° |
| Filter | Frosted filter |
| Blue filter | |
| Green filter | |
| Yellow filter | |
| Focus system | Coaxialcoarse/fine focus system, with tensiona adjustable and up stop,minimum division of fine focusing:2 u m. |
| Nosepiece | Quadruple (Ball bearing inner locating) |
| Stage | Double layer mechanical (Size:180mmX150mm, moving range:15mmX15mm) |
| Illumination | 6V 20W halogen lamp, brightness control |
Trinocular Inverted Metallurgical Microscope
The metallographic microscope is a professional material analysis instrument that integrates metallographic sample observation and digital imaging functions. It is designed specifically for observing the microstructure of opaque materials such as metals, ceramics, and integrated circuits. Its core feature is the integration of a key third eyepiece port on top of an excellent metallographic optical system, providing a seamless bridge for observing, recording, and analyzing the microscopic world.
Its “metallographic” properties are reflected in the reflective bright field illumination path. The light source is emitted from around or above the objective lens, illuminating the flat polished surface of the sample, and the reflected light is then imaged through the objective lens. This design enables it to clearly distinguish key features such as grain boundaries, phase composition, inclusions, and defects (such as cracks and pores) of the material. The objective lens undergoes special correction to ensure a clear image with high contrast and no aberration under reflected light.
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